Contactless junction contrast of HgCdTe n-on-p-type structures obtained by reactive ion etching induced p-to-n conversion-Reference-Cited by-同舟云学术

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Contactless junction contrast of HgCdTe n-on-p-type structures obtained by reactive ion etching induced p-to-n conversion

Published:2001-06 Issue:6 Volume:30 Page:768-773
ISSN:0381-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Gluszak E. A.,Hinckley S.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02665870.pdf

Reference8 articles.

1. A.B. Sproul, T. Puzzer, and R.B. Bergemann (Paper presented at 2nd World Conf. on Photovoltaic Solar Conversion, Vienna, Austria, 1998).

2. A.T. Paxton, A. Sher, M. Berding, M. Van, and M.W. Muller,J. Electron. Mater. 24, 525 (1995).

3. V.K.S. Ong, K.T. Lau, and J.G. Ma,IEEE Trans Electron Devices, 47, 897 (2000).

4. SEMICAD DEVICE, ver. 1.2 (Sunnyvale, CA: Dawn Technologies Inc.).

5. DAVINCI, ver. 1999. 2.0 (Fremont, CA: TMA Inc., 1999).

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A junction-level optoelectronic characterization of etching-induced damage for third-generation HgCdTe infrared focal-plane array photodetectors;Infrared Physics & Technology;2018-06

2. Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays;Optics Letters;2017-03-27

3. Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors;Science China Physics, Mechanics & Astronomy;2014-12-18

4. Application of lateral photovoltage towards contactless light beam induced current measurements and its dependence on the finite beam size;Review of Scientific Instruments;2014-07

5. The role of localized junction leakage in the temperature-dependent laser-beam-induced current spectra for HgCdTe infrared focal plane array photodiodes;Journal of Applied Physics;2013-11-07

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