Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://link.springer.com/content/pdf/10.1007/s11433-014-5627-6.pdf
Reference77 articles.
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3. Musca C A, Redfern D A, Dell J M, et al. Laser beam induced current as a tool for HgCdTe photodiode characterization. Microelectron J, 2000, 31: 537–544
4. Redfern D A, Smith E, Musca C A, et al. Interpretation of current flow in photodiode structures using laser beam-induced current for characterization and diagnostics. IEEE Trans Electron Dev, 2006, 53: 23–31
5. Hu W D, Chen X S, Ye Z H, et al. Polarity inversion and coupling of laser beam induced current in As-doped long-wavelength HgCdTe infrared detector pixel arrays: Experiment and simulation. Appl Phys Lett, 2012, 101: 181108
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