Laboratory Techniques for Transmission X-Ray Topography-Reference-Cited by-同舟云学术

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Laboratory Techniques for Transmission X-Ray Topography

Published:1980 Issue: Volume: Page:368-400
ISSN:
Container-title:Characterization of Crystal Growth Defects by X-Ray Methods
language:
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Author:

Chikawa J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-1126-4_15

Reference75 articles.

1. A.R. Lang (1970) in Modern Diffraction and Imaging Techniques in Materials Science (ed S. Amelinckx R. Gevers, G.Remaut, J. van Landuyt,North Holland Amsterdam)p. 407

2. A. Authier (1978) in X-ray Optics (ed. H.-J. Queisser)Springer-Verlag p. 145

3. B.K. Tanner (1976) X-ray Diffraction Topography,Pergamon Press, Oxford

4. R.E. Green Jnr. (1971) Advances in X-ray Analysis 14, 311

5. W. Hartmann: in Ref. 2 p. 191

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synchrotron X-ray topographic study of dislocations and stacking faults in InAs;Journal of Crystal Growth;2005-10

2. Superheat of silicon crystals observed by live X-ray topography;Proceedings of the Japan Academy, Series B;2004

3. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

4. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06

5. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

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