Superheat of silicon crystals observed by live X-ray topography
Author:
Affiliation:
1. Center for Advanced Science and Technology
Publisher
Japan Academy
Subject
General Physics and Astronomy,General Agricultural and Biological Sciences,General Medicine
Link
http://www.jstage.jst.go.jp/article/pjab/80/7/80_7_317/_pdf
Reference15 articles.
1. Live X-Ray Topography and Crystal Growth of Silicon
2. 2) James, R. W. (1965) The Optical Principles of the Diffraction of X-Rays, 3rd ed., Cornell University Press, Ithaca, New York.
3. The influence of dislocations on crystal growth
4. Silicon Crystals Free of Dislocations
5. A method of obtaining an extremely parallel X-ray beam by successive asymmetric diffractions and its applications
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