Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry
Author:
Affiliation:
1. Chemistry Department, Pennsylvania State University, 16802, University Park, PA, USA
2. Fakultät für Physik, Universität Duisburg–Essen, 47048, Duisburg, Germany
Publisher
American Chemical Society (ACS)
Subject
Spectroscopy,Structural Biology
Link
http://link.springer.com/content/pdf/10.1007/s13361-015-1283-y.pdf
Reference25 articles.
1. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams
2. Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples
3. Sputtered ion emission under size-selected Ar n + cluster ion bombardment
4. TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+
5. Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
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