Sensitivity enhancement using chemically reactive gas cluster ion beams in secondary ion mass spectrometry (SIMS)-Reference-Cited by-同舟云学术

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Sensitivity enhancement using chemically reactive gas cluster ion beams in secondary ion mass spectrometry (SIMS)

Published:2022-01-10 Issue:4 Volume:54 Page:349-355
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surface & Interface Analysis

Author:

Lagator Matija¹^ORCID,Berrueta Razo Irma¹,Royle Thomas¹,Lockyer Nicholas P.¹

Affiliation:

1. Department of Chemistry, Photon Science Institute University of Manchester Manchester UK

Funder

Henry Royce Institute

University of Manchester

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7054

Reference35 articles.

1. Matrix-free detection of intact ions from proteins in argon-cluster secondary ion mass spectrometry

2. Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry - How do polyatomic primary beams C60+, Ar2000+, water-doped Ar2000+and (H2O)6000+compare?

3. High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry

4. Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

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1. Reactive Gas Cluster Ion Beams for Enhanced Drug Analysis by Secondary Ion Mass Spectrometry;Analytical Chemistry;2024-09-13

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3. Emerging Technologies: Use of Secondary Ion Mass Spectrometry for the Analysis of Forensic Evidence;Applications of Mass Spectrometry for the Provision of Forensic Intelligence;2023-12-20

4. Visualisation of drug distribution in skin using correlative optical spectroscopy and mass spectrometry imaging;Journal of Controlled Release;2023-12

5. Inelastic processes under gas cluster ion bombardment of metals;Vacuum;2023-10

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