A diffusion problem in semiconductor technology
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Mathematics
Link
http://link.springer.com/content/pdf/10.1007/BF00042845.pdf
Reference23 articles.
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3. W.H. Hackett, Electron-beam excited minority-carrier diffusion profiles in semiconductors, J. Appl. Phys. 43 (1972) 1649?1654.
4. F. Berz and H.K. Kuiken, Theory of life time measurements with the scanning electron microscope: steady state, Solid-State Electron. 19 (1976) 437?445.
5. H.K. Kuiken, Theory of lifetime measurements with the scanning electron microscope: transient analysis, Solid-State Electron. 19 (1976) 447?450.
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