Electron‐Beam Excited Minority‐Carrier Diffusion Profiles in Semiconductors

Author:

Hackett W. H.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 116 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Electron Beam-Induced Current;Reference Module in Materials Science and Materials Engineering;2016

2. Physical understanding and technological control of carrier lifetimes in semiconductor materials and devices: A critique of conceptual development, state of the art and applications;Progress in Quantum Electronics;2005-01

3. Non-contact evaluation of semiconductors using a laser SQUID microscope;Physica C: Superconductivity;2002-08

4. Electron Beam-induced Current;Encyclopedia of Materials: Science and Technology;2001

5. Deep-level defects at lattice-mismatched interfaces in GaAs-based heterojunctions;Journal of Physics: Condensed Matter;2000-11-21

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