Theory of lifetime measurements with the scanning electron microscope: Transient analysis
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Theory of life time measurements with the scanning electron microscope: Steady state
2. Measurement of spatial variations of the carrier lifetime in silicon power devices
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4. F. Berz, Private communication (1975)
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