Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction
Author:
Funder
Helmholtz-Gemeinschaft
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s10853-017-0909-9.pdf
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