Sensing strain-induced symmetry breaking by reflectance anisotropy spectroscopy-Reference-Cited by-同舟云学术

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Sensing strain-induced symmetry breaking by reflectance anisotropy spectroscopy

Published:2021-10-11 Issue:15 Volume:119 Page:151602
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Volpi M.¹^ORCID,Beck S.²³^ORCID,Hampel A.³^ORCID,Galinski H.¹^ORCID,Sologubenko A.¹⁴,Spolenak R.¹

Affiliation:

1. Department of Materials, Laboratory for Nanometallurgy, ETH Zurich, Vladimir-Prelog-Weg 5, Zurich 8093, Switzerland

2. Department of Materials, Materials Theory, ETH Zurich, Wolfgang-Pauli-Str. 27, Zurich 8093, Switzerland

3. Center for Computational Quantum Physics, Flatiron Institute, 162 5th Avenue, New York, New York 10010, USA

4. Scientific Center for Optical and Electron Microscopy, ScopeM, ETH Zurich, Vladimir-Prelog-Weg 5, Zürich 8093, Switzerland

Funder

Strategic Focus Area Advanced Manufacturing Project

Simons Foundation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0060930

Reference32 articles.

1. Strain engineering of the magnetic multipole moments and anomalous Hall effect in pyrochlore iridate thin films

2. Breaking the absorption limit of Si toward SWIR wavelength range via strain engineering

3. Strain engineering and epitaxial stabilization of halide perovskites

4. Electric Field Effect in Atomically Thin Carbon Films

5. Excitons in strain-induced one-dimensional moiré potentials at transition metal dichalcogenide heterojunctions

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bismuth Ordering and Optical Anisotropy in GaAsBi Alloys;physica status solidi (b);2024-08-26

2. Strain mapping in amorphous germanium thin films with scanning reflectance anisotropy microscopy;Applied Physics Letters;2024-07-22

3. Data reduction for spatially resolved reflectance anisotropy spectrometer;Review of Scientific Instruments;2023-10-01

4. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy Microscopy;Advanced Functional Materials;2023-06-30

5. Sensing Sub‐Surface Strain in GaAsBi(001) Surfaces by Reflectance Anisotropy Spectroscopy;physica status solidi (b);2022-09-04

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