Secondary Neutral Mass Spectrometry (SNMS) and Its Application to Depth Profile and Interface Analysis

Author:

Oechsner H.

Publisher

Springer Berlin Heidelberg

Reference59 articles.

1. C.A. Andersen, J.R. Hinthorne: Analytical Chem. 45, 1421 (1973)

2. H.W. Werner: “Secondary Ion Mass Spectrometry”, in Electron and Ion Spectroscopy of Solids, ed. by L. Fiermans, J. Vennik, W. Dekeyser (Plenum Press, New York, London 1978)

3. Z. Sroubek: Nucl. Instr. Meth. 194, 533 (1982)

4. H. Oechsner, Z. Sroubek: Surface Sci. 127, 10 (1983)

5. H. Oechsner: Appl. Phys. 8, 185 (1975)

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