The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis-Reference-Cited by-同舟云学术

The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis

Published:1984 Issue: Volume: Page:5-38
ISSN:0342-6793
Container-title:Thin Film and Depth Profile Analysis
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Author:

Werner H. W.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-46499-7_2.pdf

Reference73 articles.

1. H.W. Werner: In Electron Microscopy 1980, Vol.3, Analysis, ed. by R. Brederoo and V.E. Cosslett (Published by the Seventh European Congress on Electron Microscopy Foundation, Leiden 1980) p.200

2. H.W. Werner, H.A.M. de Grefte: Vakuum-Technik 17, 37 (1968)

3. H.W. Werner: In Electron and Ion Spectroscopy of Solids, ed. by W. Dekeyser, J. Vennik, and L. Fiermans (Plenum, New York 1978) p.324

4. H. Liebl: J. Phys. E8, 797 (1975)

5. P. Gourgout: Private communication (1978)

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