Interface and thin film analysis: Comparison of methods, trends-Reference-Cited by-同舟云学术

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Interface and thin film analysis: Comparison of methods, trends

Published:1990 Issue:6 Volume:337 Page:594-613
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

Werner H. W.,Torrisi A.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00323094.pdf

Reference80 articles.

1. Vriezema R (1989) private communication

2. Ruedenauer FG (1984) private communication

3. Mulders JJL (1986) private communication

4. Werner HW (1984) In: Oechsner (ed) Topics in current physics, vol 37; Thin film and depth profile analysis. Springer, Berlin Heidelberg New York, p 5

5. Springer Series in Optical Sciences;L Reimer,1985

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