Source-End Layouts on ESD/LU Reliabilities in an HV 0.25 um 60 V nLDMOS

Author:

Chen Shen-Li,Lee Min-Hua,Wu Tzung-Shian,Lai Yi-Sheng,Lin Chun-Ju,Chen Hsun-Hsiang

Publisher

Springer New York

Reference12 articles.

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3. Miyamoto M. Sugii N. Kumagai, Y, Kimura Y (2010) In: IEEE 23rd international symposium on power semiconductor devices and ICs (ISPSD), San Diego, 2011, pp 168–171

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5. Ker M-D, Hsu C-L, Chen W-Y (2010) In: IEEE international symposium on circuits and systems, Paris, 2010, pp 989–992

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