Impacts of the Drain-side nWell Adding on ESD Robustness in 0.25-μm LV/HV nMOSTs
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Published:2014
Issue:
Volume:7
Page:51-56
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ISSN:2212-6716
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Container-title:AASRI Procedia
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language:en
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Short-container-title:AASRI Procedia
Author:
Chen Shen-Li,Lee Min-Hua
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