Author:
Kupris G.,R��ler H.,Ecke G.,Hofmann S.
Publisher
Springer Science and Business Media LLC
Subject
Biochemistry,Analytical Chemistry,Biochemistry
Cited by
19 articles.
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1. Quantitative Compositional Depth Profiling;Springer Series in Surface Sciences;2012-06-01
2. Sputter-depth profiling for thin-film analysis;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2003-11-25
3. MC simulations of depth profiling by low energy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-01
4. Profile reconstruction in sputter depth profiling;Thin Solid Films;2001-11
5. Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS;Surface and Interface Analysis;2000