Approaching the limits of high resolution depth profiling-Reference-Cited by-同舟云学术

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Approaching the limits of high resolution depth profiling

Published:1993-06 Issue: Volume:70-71 Page:9-19
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hofmann S.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference75 articles.

1. Compositional depth profiling by sputtering

2. Practical Surface Analysis with AES and XPS,1990

3. Thin Film and Depth Profile Analysis,1984

4. High resolution compositional depth profiling

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