High-Resolution Microscopy of Latent Tracks Induced by High-Energy Heavy Ions-Reference-Cited by-同舟云学术

High-Resolution Microscopy of Latent Tracks Induced by High-Energy Heavy Ions

Published:1998 Issue: Volume: Page:3-18
ISSN:
Container-title:Advances in Fission-Track Geochronology
language:
Short-container-title:

Author:

Vetter J.,Ackermann J.,Neumann R.,Nistor L.,Scholz R.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-015-9133-1_1

Reference56 articles.

1. Ackermann J. (1994): Rasterkraftmikroskopie an Schwerionen-bestrahlten Materialien: Spuruntersuchungen und Entwicklung eines UHV-Kraftmikroskops, Doctoral thesis, University of Heidelberg.

2. Ackermann J., Angert N., Grafström S., Hagen T., Neitzert M., Neumann R. and Trautmann, C. (1995): Force microscopy of heavy-ion irradiated materials. In: Forces in Scanning Probe Methods (eds. Güntherodt H.-J., Anselmetti D. and Meyer E. ), Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 489–494.

3. Ackermann J., Angert N., Neumann R., Trautmann C., Dischner M., Hagen T. and Sedlacek M. (1996): Ion track diameters in mica studied with scanning force microscopy. Nucl. Instrum. and Meth. B 107, 181–184.

4. Ackermann J., Grafström S., Hagen T., Kowalski J., Neumann R. and Sedlacek M. (1997): Scanning force microscopy of latent heavy-ion tracks in ultrahigh vacuum. In: Micro/Nanotribology and its applications (ed. Bhushan B. ), Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 261–267.

5. Albrecht D., Armbruster P., Spohr R., Roth M., Schaupert K. and Stuhrmann H. (1985): Investigation of heavy ion produced defect structures in insulators by small angle scattering. Appl. Phys. A 37, 37–46.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Science and technology on the nanoscale with swift heavy ions in matter;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-11

2. Modifications induced by swift heavy ions;Bulletin of Materials Science;1999-05

3. Scanning probe microscopy of ion-irradiated materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-05

4. Scanning force microscopy of heavy-ion tracks in lithium fluoride;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-12