Force Microscopy of Heavy Ion Irradiated Materials-Reference-Cited by-同舟云学术

Force Microscopy of Heavy Ion Irradiated Materials

Published:1995 Issue: Volume: Page:489-494
ISSN:
Container-title:Forces in Scanning Probe Methods
language:
Short-container-title:

Author:

Ackermann J.,Angert N.,Grafström S.,Hagen T.,Neitzert M.,Neumann R.,Trautmann C.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-011-0049-6_43

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5. R. Coratger, A. Claverie, F. Ajustron, J. Beauvillain, Surf. Sci. 227, 7 (1990)

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1. Scanning probe microscopy of ion-irradiated materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-05

2. Scanning force microscopy of heavy-ion tracks in lithium fluoride;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-12

3. High-Resolution Microscopy of Latent Tracks Induced by High-Energy Heavy Ions;Advances in Fission-Track Geochronology;1998

4. Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum;Micro/Nanotribology and Its Applications;1997