Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum
Author:
Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-94-011-5646-2_17
Reference29 articles.
1. Silk, E. C. H., Barnes, R. S. (1959) Examination of fission fragment tracks with an electron microscope, Phil. Mag. 4, 970–972
2. Dartyge, E., Lambert, M., (1974) Formation de defauts dans les echantillons de mica muscovite irradies par des ions de grand energie, Radial. Eff. 21, 71–79
3. Dartyge, E., Duraud, J. P., Langevin, Y., Maurette, M. (1981) New model of nuclear particle tracks in dielectric minerals, Phys. Rev. B 23, 5213–5229
4. Albrecht, D., Armbruster, P., Spohr, R., Roth, M., Schaupert, K., Stuhrmann, H. (1985) Investigation of heavy ion produced defect structures in insulators by small angle scattering, Appl. Phys. A 37, 37–46
5. Albrecht, D., Balanzat, E., Schaupert, K. (1986) X-ray small angle scattering investigation of high energy Ar-tracks in mica, Nucl. Tracks Radial. Meas. 11, 93–94
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1. Damage production yield by electron excitation in mica for ion and cluster irradiations;Philosophical Magazine A;2001-12
2. Scanning force microscopy in a liquid on single latent ion tracks: Towards applications in polymers and atomic resolution on crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-05
3. Scanning probe microscopy of ion-irradiated materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-05
4. Surface track formation on mica surfaces due to grazing incidence 20.2 MeV C60 ions: a comparative study employing shadow-replica electron microscopy, tapping-mode and phase-imaging scanning force microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01
5. Scanning force microscopy of heavy-ion tracks in lithium fluoride;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-12
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