Scanning probe microscopy of ion-irradiated materials-Reference-Cited by-同舟云学术

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Scanning probe microscopy of ion-irradiated materials

Published:1999-05 Issue:1-4 Volume:151 Page:42-55
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Neumann R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference93 articles.

1. Track separation due to dissociation of MeV C60 inside a solid

2. Summary Abstract: Surface morphology of oxidized and ion-etched silicon by scanning tunneling microscopy

3. Surface morphology of oxidized and ion‐etched silicon by scanning tunneling microscopy

4. Effects of isolated atomic collision cascades onSiO2/Si interfaces studied by scanning tunneling microscopy

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