SIMS depth profile analysis using MCs+ molecular ions-Reference-Cited by-同舟云学术

SIMS depth profile analysis using MCs+ molecular ions

Published:1991 Issue:1-2 Volume:341 Page:54-56
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

Gnaser H.,Oechsner H.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00322106.pdf

Reference10 articles.

1. Benninghoven A, R�denauer FG, Werner HW (1987) Secondary ion mass spectrometry, Wiley, New York

2. Wilson RG, Stevie FA, Magee CW (1989) Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analyis. Wiley, New York

3. Storms HA, Brown KF, Stein JD (1977) Anal Chem 49:2023

4. Ray MR, Baker JE, Loxton CM, Greene JE (1988) J Vac Sci Technol A6:44

5. Gao Y (1988) J Appl Phys 64:3760

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