A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test-Reference-Cited by-同舟云学术

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A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test

Published:2011-03-11 Issue:3 Volume:27 Page:389-402
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Ciganda Brasca Lyl M.,Bernardi Paolo,Sonza Reorda Matteo,Barbieri Dimitri,Bonaria Luciano,Losco Roberto,Marcigot Luciano,Straiotto Maurizio

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-011-5210-2.pdf

Reference20 articles.

1. Allen HV, Terry SC, de Bruin DW (1989) Self-testable accelerometer systems. IEEE Micro Electro Mechanical Systems proc 113–115. doi: 10.1109/MEMSYS.1989.77973

2. Bernardi P, Sonza Reorda M (2008) A novel methodology for reducing SoC test data volume on FPGA-based testers. DATE proc 2008:194–199. doi: 10.1109/DATE.2008.4484685

3. Charlot B, Mir S, Parrain F, Courtois B (2001) Electrically induced stimuli for MEMS self-test. VTS Proc 2001:210–215

4. Chatfield AB (1997) Fundamentals of high accuracy inertial navigation. AIAA, Progress in Astronautics and Aeronautics Series, 174

5. Cheng H, Zhao Y, Qiang B, Liu Y (2009) Design of testing system for accelerometer based on GP-IB. ICEMI 2009:2–548–2–551.

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