An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-011-5195-x.pdf
Reference29 articles.
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3. Bainbridge WJ, Toms WB, Edwards DA, Furber SB (2003) Delay-insensitive, point-to-point interconnect using m-of-n codes. Proceedings of International Symposium on Asynchronous Circuits and Systems, pp 132–140
4. Beest F, Peeters A (2005) A multiplexor based test method for self-timed circuits. Proceedings of International Symposium on Asynchronous Circuits and Systems, pp 166–175
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