Learning-based reliability assessment method for detection of permanent faults in clockless circuits-Reference-Cited by-同舟云学术

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Learning-based reliability assessment method for detection of permanent faults in clockless circuits

Published:2019-09 Issue: Volume:100-101 Page:113365
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Aquino Guazzelli Ricardo,Garay Trindade Matheus,Fesquet Laurent,Possamai Bastos Rodrigo

Funder

Université Grenoble Alpes

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Digital Systems Testing and Testable Design;Abramovici,1990

2. The space radiation environment for electronics;Stassinopoulos;Proc. IEEE,1988

3. Influence of body-biasing, supply voltage, and temperature on the detection of resistive short defects in FDSOI technology;Karel,2017

4. Impact of PVT variation on delay test of resistive open and resistive bridge defects;Zhong,2013

5. Essentials of Electronic Testing for Digital, Memoryand Mixed-Signal VLSI Circuits;Bushnell,2002

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fault Detection Method for Suspension Systems of Maglev Train Based on Optimized Random Matrix Theory;IEEE Access;2020

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