A Design of Linearity Built-in Self-Test for Current-Steering DAC
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-010-5187-2.pdf
Reference21 articles.
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2. Arabi K, Kaminska B, Rzeszut J (1994) A built-in-self-test approach for medium to high-resolution digital-to-analog converters. In: Proc IEEE Asian Test Symp(ATS), pp 373–378
3. Burns M, Roberts GW (2001) An introduction to mixed-signal IC test and measurement. Oxford University Press, Oxford
4. Chang S-J, Lee C-L, Chen J-E (2002) BIST scheme for DAC testing. Electron Lett 38(7):776–777
5. Daubert SJ, Vallancourt D (1990) Operation and analysis of current copier circuit. IEE Proceeding 137(4):109–115
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