A reduced-code method for integral nonlinearity testing in DACs

Author:

Daponte Pasquale,De Vito Luca,Iadarola Grazia,Rapuano Sergio

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices, IEEE Std. 1658-2011,2012

2. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std 1241-2010,2011

3. The Data Conversion Handbook;Kester,2005

4. On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering;Xing,2008

5. A design of linearity built-in self-test for current-steering DAC;Ting;J. Electron. Test.,2011

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