1. IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices, IEEE Std. 1658-2011,2012
2. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std 1241-2010,2011
3. The Data Conversion Handbook;Kester,2005
4. On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering;Xing,2008
5. A design of linearity built-in self-test for current-steering DAC;Ting;J. Electron. Test.,2011