DAC Standardization and Advanced Testing Methods

Author:

Balestrieri Eulalia,Carnì Domenico Luca,Daponte Pasquale,De Vito Luca,Grimaldi Domenico,Rapuano Sergio

Publisher

Springer Berlin Heidelberg

Reference38 articles.

1. IEC 60748–4: Semiconductor Devices—Integrated Circuits—Part 4: Interface integrated circuits—Sec. 2: Blank detail specification for linear analogue-to-digital converters, 2nd edn. (1997)

2. IEEE Standard 746: IEEE Standard for performance measurements of A/D and D/A converters for PCM television video circuits (1984)

3. JEDEC Standard 99, A.01: Terms, definitions, and letter symbols for microelectronic devices (2000)

4. EBU Technical Information I15: Testing for conformity with ITU-R recommendations BT.601 and BT.656 (1998)

5. IEEE Std. 1658: IEEE Standard for terminology and test methods for digital-to-analog converter devices (2012)

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