Author:
Kochte Michael A.,Zoellin Christian G.,Wunderlich Hans-Joachim
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference45 articles.
1. Abramovici M, Stroud CE, Hamilton C, Wijesuriya S, Verma V (1999) Using roving stars for on-line testing and diagnosis of fpgas in fault-tolerant applications. In: Proc. IEEE Int’l Test Conference (ITC), pp 973–982
2. Agarwal VK, Cerny E (1981) Store and generate built-in-testing approach. In: Proc. international symposium on Fault-Tolerant Computing (FTCS‘81), pp 35–40
3. Al-Asaad H, Moore P (2006) Non-concurrent on-line testing via scan chains. In: IEEE systems readiness technology conference, pp 683–689
4. Bardell P, McAnney W, Savir J (1987) Built-in test for VLSI: pseudorandom techniques. Wiley-Interscience, New York, NY, USA
5. Baumann R (2005) Soft errors in advanced computer systems. IEEE Des Test Comput 22(3):258–266
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献