A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-013-5380-1.pdf
Reference23 articles.
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5. Drineas P, Makris Y (2003) Concurrent fault detection in random combinational logic. In: International symposium on quality of electronic design (ISQED), pp 425–430
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