Digital Systems Testing and Testable Design

Author:

Abramovici Miron,Breuer Melvin A.,Friedman Arthur D.

Publisher

IEEE

Cited by 84 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Use of Modern Routing Methods in Data Transmission Networks;2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM);2024-06-28

2. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

3. Structural Testing: Vmin Silicon Issues and Solutions;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

4. Functional Compaction for Functional Test Sequences;IEEE Access;2024

5. A New Framework for RTL Test Points Insertion Facilitating a “Shift-Left DFT” Strategy;2023 IEEE International Test Conference (ITC);2023-10-07

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