Author:
Girard Patrick,Nicolici Nicola,Wen Xiaoqing
Cited by
93 articles.
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1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18
3. Advanced Characterization and Testing Techniques;Handbook of Integrated Circuit Industry;2023-11-28
4. GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting;IEICE Transactions on Information and Systems;2023-10-01
5. Test Point Insertion for Multi-Cycle Power-On Self-Test;ACM Transactions on Design Automation of Electronic Systems;2022-09-13