Author:
Shur M.,Simin G.,Rumyantsev S.,Jain R.,Gaska R.
Reference167 articles.
1. Levinshtein M E, Rumyantsev S L, Shur M S, Properties of Advanced Semiconductor Materials: GaN, AlN, InN, BN, SiC, and SiGe, John Wiley and Sons, New York (2001)
2. Bykhovski A, Gelmont B, Shur M S, J. Appl. Phys., 74(11), 6734 (1993)
3. Ambacher O, Foutz B, Smart J, Shealy J R, Weimann N G, Chu K, Murphy M, Sierakowski A J, Schaff W J, Eastman L F, Dimitrov R, Mitchell A, Stutzmann M, J. Appl. Phys., 87, 334 (2000)
4. Gaska R, Yang J W, Osinsky A, Chen Q, Khan M A, Orlov A O, Snider G L, Shur M S, Appl. Phys. Lett., 72(6), 707 (1998)
5. Frayssinet E, Knap W, Lorenzini P, Grandjean N, Massies J, Skierbiszewski C, Suski T, Grzegory I, Porowski S, Simin G, Hu X, Khan M A, Shur M S, Gaska R, Maude D, Appl. Phys. Lett., 77(16), 2551 (2000)
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献