Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. For a review of various techniques see, C. T. Sah, L. Forbes, L. I. Rosier and A. F. Tasch, Jr, Solid State Electronics13, 759 (1970).
2. H. G. Grimmeiss, L. A. Ledebo, C. Ovren and T. N. Morgan, Proc. XII Int. Conf. on the Physics of Semi-conductors, Stuttgart 1974, p. 386.
3. H. Kukimoto, C. H. Henry and F. R. Merritt, Phys. Rev.B7, 2486 (1973). and C. H. Henry, H. Kukimoto, G. L. Miller and F. R. Merritt, Ibid p. 2499.
4. See the review: “Many-Electron Theory of Photoemission” by R. L. Martin and D. A. Shirley inElectron Spectros-copy: Theory,Techniques,and Applications, A. D. Baker and C. R. Brundle, eds. (Academic Press, to be published) and the paper by the same authors in J. Chem. Phys. (1975) (to be published). Note, however, that photoemission experiments normally measure emitted electrons far above threshold. In P-I where spectra are observed near threshold additional selection rules may apply.
5. Although the energy of the L1 edge had not been pre-viously measured, recent electroreflectance data taken at 80K by D. E. Aspnes and C. G. Olson, Phys. Rev. Letters23, 1605 (1974), suggest that it is nearly degenerate with Г1 , in agreement with this assignment.
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