Author:
Balivada Ashok,Zheng Hong,Nagi Naveena,Chatterjee Abhijit,Abraham Jacob A.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference17 articles.
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5. M.J. Marlett and J.A. Abraham, ?DC-IATP: An Iterative Analog Circuit Test Generation Program for Generating DC Single Pattern Tests?, Proc. IEEE Int'l Test Conference, 1988, pp. 839?845.
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