Author:
Akbay S. Sermet,Chatterjee Abhijit
Cited by
9 articles.
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2. Gaussian Process-Based Wafer-Level Correlation Modeling and Its Applications;Machine Learning in VLSI Computer-Aided Design;2019
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4. Efficient Process Shift Detection and Test Realignment;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-12
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