Fault diagnosis of analog circuit based on a second map SVDD-Reference-Cited by-同舟云学术

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Fault diagnosis of analog circuit based on a second map SVDD

Published:2015-06-27 Issue:3 Volume:85 Page:395-404
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Jiang Yuanyuan,Wang Youren,Luo Hui

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities and Funding of Jiangsu Innovation Program for Graduate Education

Aviation Science Foundation of China

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-015-0597-9.pdf

Reference38 articles.

1. Sarathi Vasan, A. S., Bing, L., & Pecht, M. (2013). Diagnostics and prognostics method for analog electronic circuits. IEEE Transactions on Industrial Electronics, 60(11), 5277–5291.

2. Luo, H., Wang, Y., & Cui, J. (2011). A SVDD approach of fuzzy classification for analog circuit fault diagnosis with FWT as preprocessor. Expert Systems with Applications, 38(8), 10554–10561.

3. Zhang, C., He, Y., Yuan, L., et al. (2014). A novel approach for analog circuit fault prognostics based on improved RVM. Journal of Electronic Testing, 30(3), 343–356.

4. Jahangiri, M., & Razaghian, F. (2014). Fault detection in analogue circuits using hybrid evolutionary algorithm and neural network. Analog Integrated Circuits and Signal Processing, 80(3SI), 551–556.

5. Xiao, Y. Q., & Feng, L. G. (2012). A novel neural-network approach of analog fault diagnosis based on kernel discriminant analysis and particle swarm optimization. Applied Soft Computing, 12(2), 904–920.

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