Author:
Sindia Suraj,Agrawal Vishwani D.,Singh Virendra
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference25 articles.
1. Balivada A, Zheng H, Nagi N, Chatterjee A, Abraham JA (1996) A unified approach to fault simulation of linear mixed-signal circuits. J Electron Test Theory Appl 9(1):29–41
2. Bhunia S, Roy K (2002) Dynamic supply current testing of analog circuits using wavelet transform. In: Proc 20th IEEE VLSI Test Symp, pp 302–307
3. Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits. Springer, Boston
4. Chua LO (1967) Introduction to nonlinear network theory. McGraw-Hill, New York
5. Epstein BR, Czigler MH, Miller SR (1993) Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans Comput Aided Des 12(1):102–113
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献