Recoil spectrometry: Ion accelerator based elemental characterisation of surface layers-Reference-Cited by-同舟云学术

Recoil spectrometry: Ion accelerator based elemental characterisation of surface layers

Published:1995-03 Issue:1-4 Volume:120 Page:171-181
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Whitlow Harry J.,Andersson Margaretha,Hult Mikael,Persson Leif,Bouanani Mohamed El,�stling Mikael,Zaring Carina,Lundberg Nils,Cohen David D.,Dytlewski Nick,Johnston Peter N.,Bubb Ian F.,Walker Scott R.,Johanson Erik,Hogmark Sture,Anders Ingemarsson P.

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244430.pdf

Reference22 articles.

1. H. J. Whitlow, A. B. Ch. Andersson, C. S. Petersson,Nucl. Instrum. Methods,1989,B36, 53.

2. H. J. Whitlow, C. S. Petersson, K. J. Reeson P. L. F. Hemment,Appl. Phys. Lett. 1988,52, 1871.

3. H. Jiang, H. G. Whitlow, M. Ostling, E. Neimi, F. M. d'Heurle, C. S. Petersson,J. Appl. Phys. 1989,65, 567.

4. P. N. Johnston, S. R. Walker, I. F. Bubb, D. D. Cohen, N. Dytlewski, M. Hult, H. J. Whitlow, C. Zaring, M. Ostling, M. Andersson,Nucl. Instrum. Methods 1994,B85, 907.

5. M. Hult, H. J. Whitlow, M. �stling, M. Andersson, Y. Andersson, I. Linderberg, K. Stahl,J. Appl. Phys. 1994,75, 835.

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