Effect of Drop Angle Variation and Restraint Mechanisms on Surface Mount Electronics Under High G Shock

Author:

Lall Pradeep1,Pandurangan Aathi Raja Ram1,Dornala Venkata Kalyan Reddy1,Suhling Jeff1,Deep John2,Lowe Ryan3

Affiliation:

1. Auburn University, Auburn, AL

2. U.S. Air Force Research Laboratories, Eglin AFB, FL

3. ARA Associates, Inc., Littleton, CO

Abstract

Abstract Defense and Aerospace applications increasingly rely on commercial off-the shelf electronics. Electronics in defense applications may be exposed to harsh environments including high-g acceleration loads. The horizontal board configuration is most frequently tested. However, other shock orientations may be more damaging depending on technology and design. The out-of-plane displacement and strain values highly depend on the angle of shock on the electronic components in the printed circuit board. The effect of variation in drop angle under high G conditions, and efficacy of supplemental restraint mechanisms on the reliability have not been studied at high-g acceleration loads in the range of 10,000g–50,000g. In this study the reliability of fine-pitch electronics and large 3640 capacitors with C0G dielectric has been studied in presence of potting compounds, different shock orientations. A circular printed circuit board has been designed with daisy-chained packages. The drop angle has been varied from zero-degree to 30-degree. A drop-tower with dual mass shock amplifier has been used to achieve the desired acceleration pulse. Transient dynamic deformation has been measured using high-speed imaging in conjunction with digital image correlation.

Publisher

American Society of Mechanical Engineers

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Amplification effect and influencing factors of rebound-collision impact amplifier;Journal of Vibration and Control;2024-07-20

2. Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging;IEEE Transactions on Device and Materials Reliability;2024-06

3. Interfacial Reliability and Predictive Models for Potted Board Assemblies in Inclined 25000 g Mechanical Shock;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

4. Predictive Cohesive Zone Prediction of Delamination at Potting-PCB Interface Under Dynamic Loading and Sustained High-Temperature Exposure;2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm);2023-05-30

5. Evolution of Interfacial Properties under Long Term Isothermal Aging of PCB/Potting Compound Interfacial Samples under Pure Mode-I Loading;2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm);2022-05-31

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3