Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices

Author:

Song Jizhou1,Lu Chaofeng2,Xie Xu3,Li Yuhang,Zhang Yihui4,Grosse Kyle L.5,Dunham Simon3,Huang Yonggang4,King William P.5,Rogers John A.6

Affiliation:

1. Department of Mechanical and Aerospace Engineering, University of Miami, Coral Gables, FL 33146 e-mail:

2. Department of Civil Engineering and Soft Matter Research Center, Zhejiang University, Hangzhou 310058, China

3. Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801

4. Department of Civil and Environmental Engineering, Department of Mechanical Engineering, Northwestern University, Evanston, IL 60208

5. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801

6. Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory, Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801

Abstract

An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single-walled carbon nanotube (SWNT) devices by scanning Joule expansion microscopy (SJEM). A simple scaling law for thermal expansion at low frequencies, which only depends on two nondimensional geometric parameters, is established. Such a scaling law provides a simple way to determine the surface temperature distribution and power dissipation per unit length in an SWNT from the measured thermal expansion in experiments. The results suggest the spatial resolution of the SJEM measurement is as good as ∼50 nm.

Publisher

ASME International

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics

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