Sensor Egregium—An Atomic Force Microscope Sensor for Continuously Variable Resonance Amplification
Author:
Affiliation:
1. Department of Mechanical Engineering, University of Nevada, Reno, Reno, NV 89557-0312
2. Department of Mechanical Engineering, University of Nevada, Reno, 1664 N. Virginia Street, Reno, NV, 89557-0312
Abstract
Funder
National Science Foundation
Publisher
ASME International
Subject
General Engineering
Link
http://asmedigitalcollection.asme.org/vibrationacoustics/article-pdf/doi/10.1115/1.4050274/6658838/vib_143_4_041013.pdf
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3. Monitoring TriAcylGlycerols Accumulation by Atomic Force Microscopy Based Infrared Spectroscopy in Streptomyces Species for Biodiesel Applications;Deniset-Besseau;J. Phys. Chem. Lett.,2014
4. Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future;Balke;J. Am. Ceram. Soc.,2009
5. Li Transport in Fresh and Aged LiMn2O4 Cathodes Via Electrochemical Strain Microscopy;Luchkin;J. Appl. Phys.,2015
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