Accelerated Life Testing in Epoxy Packaged High Luminosity Light Emitting Diodes-Reference-Cited by-同舟云学术

Accelerated Life Testing in Epoxy Packaged High Luminosity Light Emitting Diodes

Published:2011-09-01 Issue:3 Volume:133 Page:
ISSN:1043-7398
Container-title:Journal of Electronic Packaging
language:en
Short-container-title:

Author:

Nogueira Eduardo¹,Vázquez Manuel²,Algora Carlos³

Affiliation:

1. EUIT Telecomunicación-Universidad Politécnica de Madrid

2. EUIT Telecomunicación - Instituto de Energía Solar-Universidad Politécnica de Madrid

3. ETSI Telecomunicación-Instituto de Energía Solar-Universidad Politécnica de Madrid

Abstract

In this work, we have evaluated the reliability of epoxy packaged light emitting diodes (LEDs) for outdoor applications by specific tests to enhance catastrophic failures that appear under high temperature and humidity operation conditions. The different failure mechanisms were analyzed observing two main types: one is open circuit catastrophic failures induced by moisture and the other one power luminosity degradation. The influence of temperature and humidity on catastrophic failures was modelled using the Arrhenius–Peck law obtaining an activation energy of 0.87 eV and a Peck parameter of 2.29. MTTF value of 1.582 × 106 h at low bias current, 10 mA, has been evaluated.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Link

http://asmedigitalcollection.asme.org/electronicpackaging/article-pdf/doi/10.1115/1.4004659/5669968/034501_1.pdf

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