Accelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking

Author:

Su Quang T.1,Gharaibeh Mohammad A.2,Stewart Aaron J.3,Pitarresi James M.3,Anselm Martin K.4

Affiliation:

1. Mechanical Engineering Department, Binghamton University, State University of New York, 4400 Vestal Parkway East, Binghamton, NY 13902-6000 e-mail:

2. Mechanical Engineering Department, The Hashemite University, Zarqa 13115, Jordan e-mail:

3. Mechanical Engineering Department, Binghamton University, State University of New York, 4400 Vestal Parkway East, Binghamton, NY 13902-6000 e-mail:

4. Manufacturing and Mechanical Engineering Technology (MMET), Center for Electronic Manufacturing and Assembly (CEMA), Rochester Institute of Technology (RIT), One Lomb Memorial Drive, Rochester, NY 14623-5603 e-mail:

Abstract

In this work, a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using the resonance tracking sinusoidal test method for assemblies, each consisting of a centrally mounted ball grid array (BGA) device assembled with 63Sn37Pb and SAC105 solder alloys. These tests show that the resonance tracking method gives more consistent failure times. Failure analysis for the tested devices shows the primary failure mode is “input” trace crack first, followed by fatigue through the solder for complete failure. A finite element (FE) model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related FE models provide the building blocks for high cycle solder fatigue plots (i.e., S–N curves).

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Combining Vibration Test With Finite Element Analysis for the Fatigue Life Estimation of PBGA Components;Microelectron. Reliab.,2008

2. Eckert, T., Muller, W., Nissen, N., and Reichl, H., 2009, “A Solder Joint Fatigue Life Model for Combined Vibration and Temperature Environments,” 59th Electronics Packaging Technology Conference, San Diego, CA, May 26–29, pp. 522–528.10.1109/ECTC.2009.5074064

3. Vibration Reliability Test and Finite Element Analysis for Flip Chip Solder Joints;Microelectron. Reliab.,2009

4. High-Cycle Fatigue Life Prediction for Pb-Free BGA under Random Vibration Loading;Microelectron. Reliab.,2011

5. Marjamaki, P., Mattila, T. T., and Kivilahti, J. K., 2006, “A Comparative Study of the Failure Mechanisms Encountered in Drop and Large Amplitude Vibration Tests,” 56th Electronic Components and Technology Conference, San Diego, CA, May 30–June 2, pp. 95–101.10.1109/ECTC.2006.1645631

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