1. Adkins, C. J., 1983, Equilibrium Thermodynamics, Cambridge University Press, New York.
2. Attardo
M. J.
, and RosenbergR., 1970, “Electromigration Damage in Aluminum Film Conductors,” Journal of Applied Physics, Vol. 41, No. 6, pp. 2381–2386.
3. Bastawros, A.-F., and Kim, K.-S., 1995, “Electro-Thermal Crack Growth Caused by Electric-Current Intensification,” Proceedings, Application of Fracture Mechanics in Electronic Packaging and Materials, EEP-11/MD-64, ASME, New York, pp. 238–244.
4. Bastawros, A.-F., and Kim, K.-S., 1997, “The Role of Electric-Current Induced Heating in Damage Evolution at the Crack Tip in Thin Films,” Proceedings, Application of Fracture Mechanics in Electronic Packaging, EEP-20/AMD-222, ASME, New York, pp. 139–144.
5. EchoTherm Manual, 1997, Version 4.2, Thermal Wave Imaging Inc., Lathrup Village, MI.