A comparison of electromigration failure of metal lines with fracture mechanics
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Computational Mechanics
Link
http://link.springer.com/content/pdf/10.1007/s10409-012-0056-0.pdf
Reference27 articles.
1. Abé, H., Sasagawa, K., Saka, M.: Electromigration failure of metal lines. Int. J. Fracture 138, 219–240 (2006)
2. Abé, H.: An extension of fracture mechanics/technology to larger and smaller cracks/defects. Proc. Jpn. Acad., Ser. B 85, 363–373 (2009)
3. Muraoka, M., Abé, H.: A new approach to evaluate the delayed fracture behavior of an optical glass fiber. Proc. MRS Symp. 226, 369–374 (1991)
4. Muraoka, M., Ebata, K., Abé, H.: Effect of humidity on small-crack growth in silica optical fibers. J. Am. Ceram. Soc. 76, 1545–1550 (1993)
5. Muraoka, M., Abé, H.: Subcritical crack growth in silica optical fibers in a wide range of crack velocities. J. Am. Ceram. Soc. 79, 51–57 (1996)
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