Optimal Test Selection for Prediction Uncertainty Reduction

Author:

Mullins Joshua1,Mahadevan Sankaran2,Urbina Angel3

Affiliation:

1. V&V, UQ, and Credibility Processes Department, Sandia National Laboratories, P.O. Box 5800, Mail Stop 0828, Albuquerque, NM 87185-0828 e-mail:

2. Department of Civil and Environmental Engineering, Vanderbilt University, VU Station B #351831, Nashville, TN 37235-1831 e-mail:

3. V&V, UQ, and Credibility Processes Department, Sandia National Laboratories, P.O. Box 5800, Mail Stop 0828, Albuquerque, NM 87185-0828

Abstract

Economic factors and experimental limitations often lead to sparse and/or imprecise data used for the calibration and validation of computational models. This paper addresses resource allocation for calibration and validation experiments, in order to maximize their effectiveness within given resource constraints. When observation data are used for model calibration, the quality of the inferred parameter descriptions is directly affected by the quality and quantity of the data. This paper characterizes parameter uncertainty within a probabilistic framework, which enables the uncertainty to be systematically reduced with additional data. The validation assessment is also uncertain in the presence of sparse and imprecise data; therefore, this paper proposes an approach for quantifying the resulting validation uncertainty. Since calibration and validation uncertainty affect the prediction of interest, the proposed framework explores the decision of cost versus importance of data in terms of the impact on the prediction uncertainty. Often, calibration and validation tests may be performed for different input scenarios, and this paper shows how the calibration and validation results from different conditions may be integrated into the prediction. Then, a constrained discrete optimization formulation that selects the number of tests of each type (calibration or validation at given input conditions) is proposed. The proposed test selection methodology is demonstrated on a microelectromechanical system (MEMS) example.

Publisher

ASME International

Subject

Computational Theory and Mathematics,Computer Science Applications,Modeling and Simulation,Statistics and Probability

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