Nonlinear Stress Modeling Scheme to Analyze Semiconductor Packages Subjected to Combined Thermal and Hygroscopic Loading

Author:

Yoon Samson1,Jang Changsoo1,Han Bongtae1

Affiliation:

1. Center for Advanced Life Cycle Engineering, Department of Mechanical Engineering, University of Maryland, College Park, MD 20742

Abstract

A nonlinear finite element modeling (FEM) scheme to analyze the combined effect of thermal and hygroscopic deformation is presented. The scheme employs the conventional moisture diffusion, heat transfer, and stress analysis routines available in the commercial FEM package, but offers a unique way of linking the routines to conduct a nonlinear stress analysis of semiconductor packages subjected to moisture as well as temperature excursions. Strategies to implement the proposed scheme using commercial finite element analysis softwares are discussed. The numerical accuracy of the scheme is confirmed with the analytical solution of elastic/viscoelastic composite cylinder subjected to the combined loading of thermal expansion and hygroscopic swelling.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference16 articles.

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2. Analysis of Package Cracking During Reflow Soldering Process;Kitano

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4. Moisture Absorption and Desorption Predictions for Plastic Ball Grid Array Packages;Galloway;IEEE Trans. Compon., Packag. Manuf. Technol., Part A

5. The Mechanics and Impact of Hygroscopic Swelling of Polymeric Materials in Electronic Packaging;Wong;J. Electron. Packag.

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