FEM Analysis of Thermal Cycle Properties of the Substrates for Power Modules.

Author:

NAGATOMO Yoshiyuki,NAGASE Toshiyuki,SHIMAMURA Shoichi

Publisher

Japan Institute of Electronics Packaging

Subject

Electrical and Electronic Engineering

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Evaluation of High cycle fatigue life of solder joint in Si power module;2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm);2022-05-31

2. A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices;Microelectronics Reliability;2022-05

3. Physicochemical-microstructural approach for modeling the crack passage at topside metallic parts in IGBT semiconductor power electronics;2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2022-04-25

4. Fatigue life evaluation accuracy of power devices using finite element method;International Journal of Fatigue;2011-09

5. Reliability Evaluation on Deterioration of Power Device Using Coupled Electrical-Thermal-Mechanical Analysis;Journal of Electronic Packaging;2010-09-01

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